Ihara, Avala. Punyafu, Sato joined the 20th International Microscopy Congress (Busan, Korea).

・Ihara (oral presentation)

「Deep learning enabled high-speed scanning transmission electron microscopy for in situ and three-dimensional observation」

・Fellow Avala (oral presentation)

「Visualization of crystal to amorphous transformation during crack propagation using in-situ S/TEM combined with EELS」

・Punyafu (oral presentation)

「Obtaining a proof of Cottrell atmosphere in austenitic steel using in-situ TEM deformation technique」

・Sato  (poster presentation)

「Development of grain boundary extraction algorithm for 4D-STEM data towards three-dimensional visualization」